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  1. Megat Harun Al Rashid Megat Ahmad, Abdul Aziz Mohamed, Azmi Ibrahim, Che Seman Mahmood, Putra, Edy Giri Rachman, Muhammad Rawi Muhammad Zin, et al.
    MyJurnal
    Alumina powder was synthesized from an aluminum precursor and studied using small angle neutron scattering (SANS) technique and complemented with transmission electron microscope (TEM). XRD measurement confirmed that the alumina produced was of high purity and highly crystalline D-phase. SANS examination indicates the formation of mass fractals microstructures with fractal dimension of about 2.8 on the alumina powder.
  2. Yusof Abdullah, Mohd Reusmaazran Yusof, Megat Harun Al Rashid Megat Ahmad, Hafizal Yazid, Abdul Aziz Mohamed, Norazila Mat Sali, et al.
    MyJurnal
    Effects of 3 MeV electron (10 mA) irradiation at room temperature on the phase, microstructure,
    electrical and life time properties of 4H-SiC wafer were investigated by scanning electron
    microscopy (SEM), X-ray diffraction (XRD), four point probe current-voltage measurements and
    positron annihilation spectroscopy. It was found that irradiation damage in SiC wafer is
    significantly increased with the increase of radiation dose as observed in SEM. Irradiation also
    resulted in modification of crystallite size as identified by XRD. The resistance of a sample before
    irradiation was found to be 0.8 MΩ, whereas for a sample irradiated at 200 kGy, the resistance as
    measured by four point probe was 5.2 MΩ. It seems that the increase of resistance hence, reduction
    in conductivities could be due to defects induced by the radiation dose received then created
    leakage currents at both reverse and low-forward biases and creation of traps in the SiC.
    Meanwhile positron annihilation spectroscopy (PAS) was used to analyse the life time of irradiated
    samples which nonetheless shows that all irradiated sample have similar life time of 151 ps. It was
    observed that that no degradation process of materials experienced by SiC wafer irradiated at 500
    kGy.
  3. Muhammad Akmal Asraf Mohamad Sharom, Zainol Abidin Ibrahim, Wan Ahmad Tajuddin Wan Abdullah, Megat Harun Al Rashid Megat Ahmad, Faridah Mohamad Idris, Abdul Aziz Mohamed
    MyJurnal
    Small angle neutron scattering (SANS) is used for probing the microstructure of materials in the range between 1-100 nm in dimension. The scattered neutrons from the target material were detected by a 128 x 128 array area sensitive, Helium gas-filled proportional counter, which is known as Position Sensitive Detector (PSD). The small angle neutron scattering (SANS) facility in Malaysian Nuclear Agency has been developed since 1995. The data acquisition system of this prototype facility consists of the two-dimensional Position Sensitive Detector (2D-PSD) and neutron monitor as a data grabber, TDC Histogram as a memory processing processor, two units of ORTEC 994 as a counter and timer and a computer as a data acquisition controller via GPIB interfacing protocol. This paper will describe on the development of GPIB interface for data acquisition of the SANS instrument on Windows based platform. The GPIB device interface and graphical user interface (GUI) for this data acquisition is developed using WaveMetrics Igor software.
  4. Azraf Azman, Mohd Rizal Mamat@Ibrahim, Anwar Abdul Rahman, Megat Harun Al Rashid Megat Ahmad, Abdul Aziz Mohamed, Muhammad Rawi Mohd Zin, et al.
    MyJurnal
    The temperature profile of a cryogenic system for cooling of beryllium filter of a small-angle neutron scattering (SANS) instrument of TRIGA MARK II PUSPATI research reactor was investigated using computational fluid dynamics (CFD) modeling and simulation. The efficient cooling of beryllium filter is important for obtaining higher cold neutron transmission for the SANS instrument. This paper presents the transient CFD results of temperature distributions via the thermal link to the beryllium and simulation of heat
    flux. The temperature simulation data are also compared with the experimental results for the cooling time and distribution to the beryllium.
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